1. P.H. Boerse, “Electron Bombardment Induced Conductivity in Lead Monoxide,” in Advances in Electronics and Electron Physics, Vol. 22A, pp. 305–314 (1966), Academic Press, New York.
2. W.S. Boyle and G.E. Smith, Charge-coupled semiconductor devices, Bell System Tech. J.
49, 587–593 (1970).
3. J.E. Carnes and W.F. Kosonocky, Noise sources in charge-coupled devices, RCA Rev,33 327–343 (1972). [See also M.F. Tompsett, The quantitative effects of interface states on the performance of charge coupled devices, IEEE Trans. Electron Devices
ED-20 45–55 (1973).]
4. M.H. Crowell, T.M. Buck, E.F. Labuda, J.V. Dalton, and E.J. Walsh, A camera tube with a silicon diode array target, Bell System Tech. J.
46, 491–495 (1967).
5. P.T. Farnsworth, Television by electron-image scanning, J. Franklin Inst.
218, 411–444 (1934).