A Scaled Electrothermal Frequency Reference in Standard 0.16μm CMOS

Author:

Kashmiri S. Mahdi,Makinwa Kofi A. A.

Publisher

Springer New York

Reference21 articles.

1. Kent JP et al (2008) Microelectronics for the real world: ‘Moore’ versus ‘More than Moore’. In: Proceedings of the IEEE custom integrated circuit conference (CICC), San Jose, CA, pp 395–402

2. Howard J et al (2010) A 48-Core IA-32 Processor in 45 nm CMOS using on-die message-passing and DVFS for performance and power scaling. IEEE J Solid-State Circ 46(1):173–183

3. Razavi B (2001) Design of analog CMOS integrated circuits. McGraw-Hill, New York

4. van Vroonhoven CPL et al (2010) A thermal-diffusivity-based temperature sensor with an untrimmed inaccuracy of ±0.2 °C (3σ) from −55 °C to 125 °C. In: IEEE ISSCC Dig. Tech. Papers, San Francisco, CA, pp 314–315

5. Kashmiri SM et al (2011) A scaled thermal-diffusivity-based frequency reference in 0.16 μm CMOS. In: IEEE 37th European solid-state circuits conference, ESSCIRC, Helsinki

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