The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides

Author:

Mattson R. A.,Ehlert R. C.

Publisher

Springer US

Reference11 articles.

1. R. C. Ehlert and R. A. Mattson, “The Characteristic X-Rays from Boron and Beryllium,” this volume, p. 456.

2. H. M. O’Bryan and H. W. B. Skinner, “The Soft X-Ray Spectroscopy of Solids,”Proc. Roy. Soc. (London)Ser. A176: 229, 1940.

3. F. Tyren, “Precision Measurements of Soft X-Rays with a Concave Grating,”Nova Acta Regiae Soc. Sci. Upsaliensis12: 7–66, 1940.

4. A. P. Lukirskii, T. M. Zimkina, and I. A. Brytov, “Study of X-Ray Spectra in the Region of Wavelengths Greater than 15 Å Using a Spectrometer with a Gold-Covered Diffraction Grating,” Op. Spear. 16: 372–5, April, 1964.

5. D. W. Fischer, “Effect of Chemical Combination on the X-Ray K Emission Spectra of Oxygen and Fluorine,” J. Chem. Phys. 42: 3814, 1 June, 1965.

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