Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection-Reference-Cited by-同舟云学术

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Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection

Published:1997 Issue: Volume: Page:695-700
ISSN:
Container-title:Advances in X-Ray Analysis
language:
Short-container-title:

Author:

Sakurai Kenji,Iida Atsuo

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-5377-9_76.pdf

Reference19 articles.

1. for example, Proc. of the 5th Workshop on Total Reflection X-Ray Fluorescence Spectroscopy and Related Spectroscopical Methods, Tsukuba, Japan, October 17-19, 1994.

2. H. Kiessig, Ann. Physik, 10:715 (1931).

3. L.G. Parratt, Phys. Rev. 95:359 (1954).

4. A. Segmuller, A.I.P. Conf. Proc., 53:78 (1979).

5. K. Sakurai and A. Iida, Jpn. J. Appl. Phys. 31:L113 (1992).

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