1. International workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 1988). 18–20 july 1988, Meudon Bellevue, France. To be published in Rev. Phys. Appl.
2. C.J. Wu and D.B. Wittry, J. Appl. Phys. 49: 2827 (1978).
3. J.W. Steeds, this issue.
4. P.M. Petroff, this issue.
5. C. Donolato, Optik, 52: 19 (1978/79); Appl. Phys. Lett. 34: 80 (1979).