The SEM as a Metallographic Tool

Author:

Vander Voort George F.

Publisher

Springer US

Reference87 articles.

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2. Wells, O. C. Scanning Electron Microscopy. New York: McGraw-Hill Book Co., 1974.

3. Goldstein, J. I., and Yakowitz, H., eds. Practical Scanning Electron Microscopy. New York: Plenum Press, 1975.

4. Goldstein, J. I., et al. Scanning Electron Microscopy and X-Ray Microanalysis. New York: Plenum Press, 1981.

5. Heinrich, K. F. J. Electron Beam X-Ray Microanalysis. New York: Van Nostrand Reinhold Co., 1981.

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