Electronic Properties of SiO2 and Models for its Point Defects-Reference-Cited by-同舟云学术

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Electronic Properties of SiO2 and Models for its Point Defects

Published:1986 Issue: Volume: Page:157-183
ISSN:
Container-title:Structure and Bonding in Noncrystalline Solids
language:
Short-container-title:

Author:

Fowler W. Beall

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-9477-2_9.pdf

Reference128 articles.

1. D. L. Griscom, J. Non-Cryst. Solids 24:155 (1977).

2. E. J. Friebele and D. L. Griscom, in Treatise on Materials Science, Vol. 17, Academic Press, New York, (1979).

3. D. L. Griscom, Proc. 32nd Freq. Control Symp., Atlantic City, NJ, 98 (Electronic Industries Assoc. Washington, DC, (1979).

4. G. H. Sigel, Jr., J. Non-Cryst. Solids 13:372 (1973–74).

5. G. N. Greaves, Phil. Mag. B 37:447 (1978).

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