1. R. Castaing, “Application des sondes électroniques à une méthode d’analyse ponctuelle chimique et cristallographique” (Application of Electron Beams to a Method for Local Chemical and Crystallographical Analysis), Thesis, University of Paris, 1951.
2. K. Heinrich, Bibliography on Electron Probe Microanalysis and Related Subjects, third edition, E. I. DuPont de Nemours & Co., Inc., Wilmington, Delaware, 1963; Supplement, 1965. (Obtainable from the author.)
3. R. Castaing and J. Descamps, “Sur les bases physiques de l’analyse ponctuelle par spectrographic x” (On the Physical Bases of Point Analysis by X-Ray Spectrography), J. Phys. Radium
16: 304, 1955.
4. P. M. Thomas, “A Method for Correcting for Atomic Number Effects in Electron Probe Microanalysis,” At. Energy Res. Estab. (Gt. Brit.) Rept. 4593, 1964.
5. D. M. Poole and P. M. Thomas, “Correction of Atomic Number Effects in Microprobe Analysis,” in: T. D. McKinley, K. F. J. Heinrich, and D. M. Wittry (eds.), The Electron Micro-probe, John Wiley & Sons, Inc., New York, 1966, p. 269.