A Simplified Method of Quantitating Preferred Orientation
Author:
Klenck Michael M.
Reference3 articles.
1. L. G. Schulz, “A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer,” J. Appl. Phys. 20: 1030–1033, 1949.
2. W. P. Chernock and P. A. Beck, “Analysis of Certain Errors in the X-Ray Reflection Method for the Quantitative Determination of Preferred Orientations,” J. Appl. Phys. 23: 341–345, 1952.
3. J. R. Holland, “Quantitative Determinations and Descriptions of Preferred Orientation,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.). Advances in X-Ray Analysis, Volume 7, Plenum Press, New York, 1964, pp. 86–93.