1. E. Desurvire, Scientific American 96, January 1992.
2. Measurement of High-Speed Signals in Solid State Devices, in: “Semiconductors and Semimetals”, Vol. 28, Ed. R.B.Marcus, Academic Press, New York (1990).
3. M.B. Ketchen, D. Grischkowsky, T.C. Chen, C.C. Chi, I.N. Duling, N.J. Hales, J.M. Halbout, J.A. Kash, and G.P. Li, Appl. Phys. Lett. 48:751 (1986).
4. C. Moglestue, J. Rosenzweig, J. Kuhl, M. Klingenstein, M. Lambdsdorff, A. Ax-mann, Jo. Schneider, and J. Hülsmann, J. Appt. Phys. 70:2435 (1991).
5. Y. Chen, S. Williamson, T. Brock, F.W. Smith, and A.R. Calawa, Appt. Phys. Lett. 59:1984 (1991).