Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry-Reference-Cited by-同舟云学术

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Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry

Published:1988 Issue: Volume: Page:507-514
ISSN:
Container-title:Advances in X-Ray Analysis
language:
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Author:

Arai Tornoya,Omote Kazuhiko

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-1035-8_59

Reference2 articles.

1. N. Spielberg and Mechtilde Brandenstein, Applied Spectroscopy Vol. 17, No. 6–9 (1963) 222–225

2. Ib Sorensen, Spectrochimica Acta, Vol. 36B No. 3 (1981) 243–249

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A structural study of the molten Bi2O3GeO2 system by the EXAFS method;Journal of Non-Crystalline Solids;1994-11

2. Intensity and distribution of background x-rays in wavelength-dispersive spectrometry;X-Ray Spectrometry;1991-02

3. Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry III;Advances in X-Ray Analysis;1990

4. Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications;Advances in X-Ray Analysis;1989

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