An Automated X-ray Microfluorescence Materials Analysis System

Author:

Wherry David C.,Cross Brian J.,Briggs Thomas H.

Publisher

Springer US

Reference10 articles.

1. M. C. Nichols and R. W. Ryon, “An X-ray Microfluorescence Analysis System with Diffraction Capabilities”, Adv. X-ray Anal. 29, (1986).

2. D. C. Wherry and B. J. Cross, “XRF, Microbeam Analysis and Digital Imaging Combined into Powerful New Technique”, Kevex Analyst 12, 8 (1986).

3. M. C. Nichols, D. R. Boehme, R. W. Ryon, D. C. Wherry, B. J. Cross and G. D. Aden, “Parameters Affecting X-ray Microfluorescence Analysis”, Adv. X-ray Anal. 30 (1987) in press.

4. D. R. Boehme, “X-ray Microfluorescence Analysis of Thin- and Thick-Sectioned Geologic Materials”, Sandia Report SAND87–8214 (Apr.1987).

5. E. P. Bertin, “Principles and Practices of X-ray Spectrometric Analysis”, 2nd edition, Chap. 19, publ. Plenum Press, NY (1975).

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