Evaluation of Soft and Hard Scattered X-Rays as an Internal Standard for Light Element Analysis

Author:

Taylor David L.,Andermann George

Publisher

Springer US

Reference20 articles.

1. M. F. Hasler, J. W. Kemp and G. Andermann, “New Instruments and Techniques Applicable to X-Ray Spectrochemical Analysis,” Proceedings, Conference on Industrial Applications of X-Ray Analysis, Fourth Annual, University of Denver Press, Denver, (1955).

2. G. Andermann, and J. W. Kemp, “Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy,” Anal. Chem., 30, 1306–1309, (1958).

3. C. E. Harvey, A Method of Semi-Quantitative Spectrochemical Analysis, Applied Research Laboratories, Glendale, California, 1947.

4. Z. H. Kaiman and L. Heller, “Theoretical Study of X-Ray Fluorescent Determination of Traces of Heavy Elements in a Light Matrix,” Anal. Chem, 34, 946–951, (1962).

5. K. P. Champion, J. C. Taylor and R. N. Whittem, “Rapid X-Ray Fluorescence Determination of Traces of Strontium in Samples of Biological and Geological Origin,” Anal. Chem., 38, 109–112, (1966).

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