Observed and Calculated XRPD Intensities for Single Substance Specimens-Reference-Cited by-同舟云学术

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Observed and Calculated XRPD Intensities for Single Substance Specimens

Published:1987 Issue: Volume: Page:351-356
ISSN:
Container-title:Advances in X-Ray Analysis
language:
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Author:

Schreiner Walter N.,Kimmel Giora

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-1935-1_42.pdf

Reference16 articles.

1. James, R.W., “The Optical Principles of the Diffraction of X-Rays”, Cornell Univ. Press, p. 41 (1965).

2. Azaroff, L.V., Acta Cryst. 8, pp. 701–704 (1955).

3. Jenkins, R., Norelco Reporter 21, No. 1, pp. 9–14 (1974).

4. International Tables for X-Ray Crystallography, Vol. IV, Table 2.2B, p. 99 (1974).

5. James, R.W., Ibid, p. 109.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Results of the JCPDS-ICDD Intensity Round Robin;Advances in X-Ray Analysis;1989

2. Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method;Advances in X-Ray Analysis;1989

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