Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis-Reference-Cited by-同舟云学术

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Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis

Published:1995 Issue: Volume: Page:101-126
ISSN:
Container-title:X-Ray Spectrometry in Electron Beam Instruments
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Author:

Statham P. J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-1825-9_8.pdf

Reference15 articles.

1. P. Statham, X-Ray Spectrom. 6, 94 (1977).

2. P. Statham, X-Ray Spectrom. 5, 16 (1976).

3. F. H. Schamber, in: Proceedings of the Symposium on X-Ray Fluorescence Analysis of Environmental Samples (T. Dzubay, ed.) Ann Arbor Science, Ann Arbor, MI, pp. 241–257 (1977).

4. P. J. Statham, Anal. Chem. 49, 2149 (1977).

5. P. L. Ryder, in: Scanning Electron Microscopy/1977, ITT Research Institute, Chicago, Illinois, pp. 273–280 (1977).

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