Application of Layered Synthetic Microstructure Crystals to WDX Microanalysis of Ultra-light Elements-Reference-Cited by-同舟云学术

Application of Layered Synthetic Microstructure Crystals to WDX Microanalysis of Ultra-light Elements

Published:1995 Issue: Volume: Page:287-303
ISSN:
Container-title:X-Ray Spectrometry in Electron Beam Instruments
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Author:

Rybka R.,Wolf R. C.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-1825-9_17.pdf

Reference15 articles.

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2. G. F. Bastin and H. J. M. Heijligers, Microanalysis of Boron in Binary Borides, Internal Report, Eindhoven University of Technology (1986).

3. G. F. Bastin, and H. J. M. Heijligers, Quantitative Electron Probe Microanalysis of Oxygen, Internal Report, Eindhoven University of Technology (1989).

4. G. F. Bastin and H. J. M. Heijligers, Quantitative Electron Probe Microanalysis of Nitrogen, Internal Report, Eindhoven University of Technology (1988).

5. G. F. Bastin, and H. J. M. Heijligers, Quantatitative Electron Probe Microanalysis of Carbon in Binary Carbides, Internal Report, Eindhoven University of Technology (1990).

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