1. C. E. Lyman, D. E. Newbury, J. I. Goldstein, D. B. Williams, A. D. Romig Jr., J. T. Armstrong, P. E. Echlin, C. E. Fiori, D. C. Joy, E. Lifshin, and K-R. Peters, Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy: A Laboratory Workbook, Plenum Press, New York (1990).
2. D. B. Williams and E. B. Steel in: Analytical Electron Microscopy-1987 (D. C. Joy, ed.) San Francisco Press, San Francisco, p. 228 (1987).
3. S. M. Zemyan and D. B. Williams, in: Proceedings of the 27th Annual MAS Meeting (J. A. Small, ed.) San Francisco Press, San Francisco, p. 1236 (1992).
4. S. M. Zemyan and D. B. Williams, J. Microsc.
174, 1 (1994).
5. G. F. Knoll, Radiation Detection and Measurement, J. Wiley and Sons, New York, p. 92 (1979).