In-Situ Stress Measurement with the Canmet Portable X-Ray Stress Diffractometer

Author:

Holt R. A.,Brauss M.,Boag J.

Publisher

Springer US

Reference9 articles.

1. B.D. Cullity, “The Elements of X-ray Diffraction” 2nd Edition, Addison-Wesley, Reading Mass., 1978.

2. M. James and J.B. Cohen, “PARS — A Portable X-ray Analyser for Residual Stress”, Journal of Testing and Evaluation, Vol. 6(1978), pp 91–97(See also U.S. patent #4095103).

3. C.O. Ruud, “X-ray Analysis and Advances in Field Instrumentation”, Journal of Metals, Vol.13, No.6(1979), pp 10–15.

4. L. Castex, J.M. Sprauel and M. Barrai, “A New, In-Situ, Automatic Strain Measuring X-ray Diffraction Apparatus with PSD”, Advances in X-ray Analysis, Vol.27(1984), pp 267–272.

5. C.M. Mitchell, “The CANMET Portable Stress Diffractometer”, Proc. International Conference on Pipeline Steels, Edmonton, Alberta (1983) Gov’t of Canada Publishing Centre, Ottawa(See also U.S. Patent # 4561062)

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-Ray Diffractometer Stress Measurements for Power Plant Field Applications;International Conference on Residual Stresses;1989

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