1. B.D. Cullity, “The Elements of X-ray Diffraction” 2nd Edition, Addison-Wesley, Reading Mass., 1978.
2. M. James and J.B. Cohen, “PARS — A Portable X-ray Analyser for Residual Stress”, Journal of Testing and Evaluation, Vol. 6(1978), pp 91–97(See also U.S. patent #4095103).
3. C.O. Ruud, “X-ray Analysis and Advances in Field Instrumentation”, Journal of Metals, Vol.13, No.6(1979), pp 10–15.
4. L. Castex, J.M. Sprauel and M. Barrai, “A New, In-Situ, Automatic Strain Measuring X-ray Diffraction Apparatus with PSD”, Advances in X-ray Analysis, Vol.27(1984), pp 267–272.
5. C.M. Mitchell, “The CANMET Portable Stress Diffractometer”, Proc. International Conference on Pipeline Steels, Edmonton, Alberta (1983) Gov’t of Canada Publishing Centre, Ottawa(See also U.S. Patent # 4561062)