Author:
Roll E. D.,Pangborn R. N.,Amateau M. F.
Reference14 articles.
1. X-Ray Studies on Mechanical Behavior of Materials, S. Taira, ed., The Society of Materials Science, Japan, 309 p. (1974).
2. S. Weissmann, “The Application of X-ray Topography to Materials Science,” in Nondestructive Evaluation of Materials, J. J. Burke and V. Weiss, eds., Plenum Publ. Corp., 69 (1979).
3. R. W. James, The Optical Principles of the Diffraction of X-Rays, G. Bell and Sons, Ltd., London (1950).
4. A. D. Kurtz, S. A. Kulin and B. L. Averbach, “Effect of Dislocations on the Minority Carrier Lifetime in Semiconductors,” Phys. Rev. 101, 4, 1285 (1956).
5. I. Manning and G. P. Mueller, “Depth Distribution of Energy Deposition by Ion Bombardment,” Comp. Phys. Comm. 7, 85 (1974).
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献