Discrete Scan Statistics Generated by Dependent Trials and Their Applications in Reliability
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Publisher
Springer New York
Link
https://link.springer.com/content/pdf/10.1007/978-1-4614-8033-4_49
Reference7 articles.
1. Eryilmaz S (2010) Discrete scan statistics generated by exchangeable binary trials. J Appl Probab 47:1084–1092
2. Eryilmaz S, Kan C, Akici F (2009) Consecutive k-within-m-out-of-n:F system with exchangeable components. Nav Res Logist 56:503–510
3. George EO, Bowman D (1995) A full likelihood procedure for analysing exchangeable binary data. Biometrics 51:512–523
4. Glaz J, Naus JI, Wallanstein S (2001) Scan statistics. Springer, New York
5. Kuo W, Zuo MJ (2003) Optimal reliability modeling, principles and applications. Wiley, Hoboken
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