Author:
Ulrich Ernst G.,Agrawal Vishwani D.,Arabian Jack H.
Reference12 articles.
1. V.D. Agrawal, “Sampling Techniques for Determining Fault Coverage in LSI Circuits, “ Jour. Digital Systems, Vol. V, pp. 189–202, 1981
2. M.A. Breuer and A.D. Friedman, Diagnosis and Reliable Design of Digital Systems, Rockville, MD: Computer Science Press, 1976.
3. S. Demba, E. Ulrich, K. Panetta, and D. Giramma, “Experiences with Concurrent Fault Simulation of Diagnostic Pro grams,” IEEE Trans. CAD, Vol. 9, pp. 621–628, June 1990.
4. S. Gai, F. Somenzi, and E. Ulrich, “Advances in Concurrent Multilevel Simulation,” IEEE Trans. CAD, Vol. CAD-6 pp. 1006–10012, November 1987.
5. S. Gai, P.L. Montessoro, and F. Somenzi, “The Performance of the Concurrent Fault Simulation Algorithms in MOZART,” Proc. Design Automation Conf., pp. 692–697, 1988.