1. M. F. Toner and G. W. Roberts, “Histogram-Based Testing of a Sigma-Delta ADC”, Proceedings, 32nd Midwest Symposium on Circuits and Systems, Washington, pp. 760–763, Aug. 1992.
2. S.D. Millman, “Improving quality: yield versus test coverage”, Journal of Electronic Testing: Theory and Applications, pp. 253–261, 1994.
3. C. Mauder and R. Tulloss, The Test Access Port and Boundary Scan Architecture, IEEE Computer Society Press Tutorial, 1990.
4. A. Grochowski, D. Bhattacharya, T.R. Viswanathan and K. Laker, “Integrated Circuit Testing for Quality Assurance in Manufacturing: History, Current Status and Future Trends”, IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, Vol. 44, pp. 610–633, August 1997.
5. K. Baker, A.M. Richardson and A.P. Dorey, “Mixed signal test-techniques, applications and demands”, IEE Proceedings-G, Circuits, Devices and Systems, Vol. 143, pp. 358–365, Dec. 1996.