Cryogenic Fiber-coupled Electro-optic Characterization Platform for High-speed Photodiodes

Author:

Priyadarshi ShekharORCID,Tian HaoORCID,Fernandez Scarioni AlexanderORCID,Wolter SilkeORCID,Kieler OliverORCID,Kohlmann JohannesORCID,Nissilä JaaniORCID,Bieler MarkORCID

Abstract

AbstractWe have developed a cryogenic characterization platform for ultrafast photodiodes, whose time domain responses are extracted by electro-optic sampling using femtosecond laser pulses in a pump-probe configuration. The excitation of the photodiodes with the pump beam and the electro-optic sampling crystals with the probe beam are realized in a fully fiber-coupled manner. This allows us to use the characterization platform at different temperatures, ranging from cryogenic to room temperature. As an application example, we characterize the time-domain response of commercial p-i-n photodiodes with a nominal bandwidth of 20 GHz and 60 GHz at temperatures of 4 K and 300 K and in a large parameter range of photocurrent and reverse bias. For these photodiodes, we detect frequency components up to approximately 250 GHz, while the theoretical bandwidth of our sampling method exceeds 1 THz. Our measurements demonstrate a significant excitation power and temperature dependence of the photodiodes’ ultrafast time responses, reflecting, most likely, changes in carrier mobilities and electric field screening. Since our system is an ideal tool to characterize and optimize the response of fast photodiodes at cryogenic temperatures, it has a direct impact on applications in superconducting quantum technology such as the enhancement of optical links to superconducting qubits and quantum-accurate waveform generators.

Funder

European Metrology Programme for Innovation and Research

Bundesministerium für Bildung und Forschung

Physikalisch-Technische Bundesanstalt (PTB)

Publisher

Springer Science and Business Media LLC

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. In-situ electro-optic sampling of microwave signals applied to superconducting circuits;2024 Conference on Precision Electromagnetic Measurements (CPEM);2024-07-08

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