Depth profiling of copper thin films by resonant laser ablation-Reference-Cited by-同舟云学术

Depth profiling of copper thin films by resonant laser ablation

Published:1995-08 Issue:2 Volume:61 Page:221-225
ISSN:0947-8396
Container-title:Applied Physics A Materials Science and Processing
language:en
Short-container-title:Appl. Phys. A

Author:

Allen T. M.,Kelly P. B.,Anderson J. E.,Taylor T. N.,Nogar N. S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01538394.pdf

Reference31 articles.

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3. A.A. Galuska, W.O. Wallace, N. Marquez, J. Uht: Sur. Interface Anal.14, 31 (1989)

4. F.M. Kimock, J.P. Baxter, D.L. Pappas, P.H. Kobrin, N. Winograd: Anal. Chem.56, 2782 (1984)

5. M.J. Pellin, C.E. Young, W.F. Calaway, D.M. Gruen: Surf. Sci.144, 619 (1984)

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