Second-order topological expansion for electrical impedance tomography
Author:
Publisher
Springer Science and Business Media LLC
Subject
Applied Mathematics,Computational Mathematics
Link
http://link.springer.com/content/pdf/10.1007/s10444-011-9205-4.pdf
Reference23 articles.
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3. Bonnaillie-Noël, V., Dambrine, M., Tordeux, S., Vial, G.: On moderately close inclusions for the Laplace equation. C. R. Math. Acad. Sci. Paris 345(11), 609–614 (2007)
4. Bonnet, M.: Higher-order topological sensitivity for 2-D potential problems. Application to fast identification of inclusions. Int. J. Solids Struct. 46(11–12), 2275–2292 (2009)
5. Borcea, L.: Electrical impedance tomography. Inverse Probl. 18(6), R99–R136 (2002)
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