1. Altschuler, H.M. (1963)Dielectric Constant,ch. 9 in Handbook of Microwave Measurements, vol.II, (eds. M. Sucher and J. Fox), Polytechnic Press, Brooklyn, New York.
2. Armistead, R. A. and Yancey, R.N. (1989) Computed tomography for the nondestructive testing of advanced engineering materials.Materials Evaluation,47(5), pp. 487–91.
3. Baker-Jarvis, J. (1990) Transmission/reflection and short-circuit line permittivity measurements, NIST Technical Note 1341, U.S. Government Printing Office, Washington, D.C., July.
4. Baker-Jarvis, J., Jones, C, Riddle, B.et al. (1995) Dielectric and magnetic measurements: A survey of nondestructive, quasi-nondestructive, and process-control techniques.Research in Nondestructive Evaluation
7(2/3), pp. 117–36.
5. Bakhtiari, S., Ganchev, S.I. and Zoughi, R. (1993) Microwave frequency optimization for accurate thickness or dielectric property monitoring of conductor backed composites.Materials Evaluation,51(6), pp. 740–43,