The Behavior of Dislocations and the Formation of Wall Structures Observed by in Situ High Voltage Electron Microscopy-Reference-Cited by-同舟云学术

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The Behavior of Dislocations and the Formation of Wall Structures Observed by in Situ High Voltage Electron Microscopy

Published:1983 Issue: Volume: Page:17-21
ISSN:
Container-title:Defects, Fracture and Fatigue
language:
Short-container-title:

Author:

Imura T.,Yamamoto A.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-009-6821-9_2.pdf

Reference4 articles.

1. Yamamoto, A., Morita, C., Tono, T., Saimoto, S., Saka, S. and Imura, T., Proc. Fifth Int. Conf. on High Voltage Electron Microscopy, Kyoto, (edited by T. Imura and H. Hashimoto), p. 133, 1977.

2. Yamamoto, A., Saka, H. and Imura, T., Kristall Tech., 14, p. 1275, 1979.

3. Yamamoto, A. and Imura, T., Electron Microscopy, p. 368, 1980.

4. Yamamoto, A. and Imura, T., Proc. Int. Conf. on Dislocation Modelling of Physical Systems, Gainesville, Florida, U.S.A., 1980.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Micromechanics of Fatigue Crack Initiation;Modelling Problems in Crack Tip Mechanics;1984

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