EBIT: An Electron Beam Source for the Production and Confinement of Highly Ionized Atoms-Reference-Cited by-同舟云学术

EBIT: An Electron Beam Source for the Production and Confinement of Highly Ionized Atoms

Published:1999 Issue: Volume: Page:429-468
ISSN:
Container-title:Advanced Technologies Based on Wave and Beam Generated Plasmas
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Author:

Fussmann G.,Biedermann C.,Radtke R.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-017-0633-9_19

Reference44 articles.

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2. Levine, M.A., Mans, R.E., Schmieder, R.W. (1985) Measurement of Instabilities and Ion Heating in an Electron Beam Ion Source, Nucl. Instrum. Meth. A237, 429–440; Levine, M.A., Mans, R.E., Henderson, J.R., Knapp, D.A., and Schneider, M.B. (1988) The Electron Beam Ion Trap: A New Instrument for Atomic Physics Measurements, Physica Scripta T22, 157–163.

3. Mans, R.E., Levine, M.A., Knapp, D.A., and Henderson, J.R. (1988) Measurement of ElectronImpact-Excitation Cross Sections for Very Highly Charged Ions, Phys. Rev. Lett. 60, 1715–1718.

4. Knapp, D., Mans, R.E., Elliott, S.R., Magee, E.W., and Zasadzinski, R. (1993) A high-energy electron beam ion trap for production of high-charge high-Z ions, Nucl. Instrum. Meth. A334, 305312.

5. Gillaspy, J.D. (1996) EBIT Spectra of Highly Stripped Ions from the Visible to the X ray, Physica Scripta T65, 168–174.

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