Microfabricated Multi-Frequency Particle Impedance Characterization System-Reference-Cited by-同舟云学术

Microfabricated Multi-Frequency Particle Impedance Characterization System

Published:2000 Issue: Volume: Page:265-268
ISSN:
Container-title:Micro Total Analysis Systems 2000
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Author:

Fuller Chris K.,Hamilton Julie,Ackler Harold,Krulevitch Peter,Boser Bernhard,Eldredge Adam,Becker Frederick,Yang Jun,Gascoyne Peter

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-017-2264-3_60

Reference6 articles.

1. W.M. Arnold, U. Zimmerman, J. of Electrostatics, 21, (1988), 151–191.

2. G. De Gasperis, X. Wang, J. Yang, F.F. Becker, P.R.C. Gascoyne, Meas. Sci. Technol., 9, (1998), 518–529.

3. Y. Liu, W. Abel, J. Janette, F. Belch, R. J. Tweedie, US Patent 5,691,633, Nov. 25, 1997.

4. W.H. Coulter, C.M. Rodriguez, US Patent 4,791,355, Dec. 13, 1988.

5. H. Ackler, P. Krulevitch, R. Miles, W. Benett, S. Swierkowski, V. Malba, P.R.C. Gascoyne, X. Wang, G. De Gasperis, Proc. 194th Meeting Elchem. Soc., Boston, (1998), 54–61.

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