High Resolution Scanning Electron Microscopy Observations of Nano-Ceramics-Reference-Cited by-同舟云学术

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High Resolution Scanning Electron Microscopy Observations of Nano-Ceramics

Published:1999 Issue: Volume: Page:109-134
ISSN:
Container-title:Impact of Electron and Scanning Probe Microscopy on Materials Research
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Author:

Hosson J.Th.M.,Haas M.,Teeuw D. H. J.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-011-4451-3_5

Reference27 articles.

1. De Hosson, J.Th.M., Vellinga, W.P., Zhou, X.B., Vitek, V., (1996) Stability of Materials, Plenum Press, New York, 581–614.

2. Taylor, D.J., Fabes, B.D. (1992), J. Non-Crystalline Solids, 147&148, 457.

3. Shaw, D.J., King, T.A., Taylor, DJ., (1992) SPIE Sol-Gel Optics, 1328, 474.

4. Arfsten, N., Lintner, B., Heming, M., Anderson, O., Ottermann, C.R., (1992) Mat. Res.Soc. Symp. Proc. 33, 449.

5. Fabes, B.D., Zelinsky, B.J.J., Taulor, DJ., Wiesenbach, L., Boggavarapu, S., Dent, D.Z., (1992) SPIE Sol-Gel Optics II, 1758, 227.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integral-geometry morphological image analysis;Physics Reports;2001-07

2. Overview of methods for analysing single ultrafine particles;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2000-10-15

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