Author:
Mischuk O. A.,Lyashenko N. I.,Mischuk V. A.
Reference2 articles.
1. Tay M., Gazecki J., McCubbery M. D. and Williams J. S., Influence of low energy electron irradiation on adhesion and electrical parameters of metal-insulator-GaAs interfaces. Nucl. Instrum. and Meth. Phys. Res. B, 1990, 46, 379–383.
2. Mischuk O. A., Lyashenko N. I., Mischuk V. A., Electron beam processing of the system: carbon-hydrogen film on metallic film. Proc. 1 All-Union conference on actual problems of technology of composite materials and radiocomponents in microelectron. information systems, Yalta (USSR), 1990, p. 226 (in Russian).