1. D. Belavič, D. Ročak, S. Mojstrovič, M. Hrovat, M. Pavlin, Characteristics of small size thick film resistors, Proc. 23rd Int. Conf. Microelectronics MIEL-95/31st Symp. on Devices and Materials SD-95, Terme atež, 1995, 151–156
2. D. Belavič, D. Ročak, J. Fajfar Plut, M. Hrovat, M. Pavlin, An evaluation of stability of small size untrimmed and laser trimmed thick film resistors, Proc. 23rd Int. Conf. Microelectronics MIEL-95/31st Symp. on Devices and Materials SD-95, Terme čatež, 1995, 157–162
3. International Standard IEC 801
4. L. Bosley, K. P. Slattery, D. Canestrari, Multichip modules: Analysis of electromagnetic interference effects by MCM implementation vs. single-chip package approach, Proc. Int. Conf. on Multichip Modules, Denver 1995, 120-125
5. R. Goyal, I/O modeling for EMI analysis of high speed digital design, Int. Symp. on Microelectronics ISHM-95, Los Angeles, 1995, 451–455