Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy-Reference-Cited by-同舟云学术

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Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy

Published:1990 Issue: Volume: Page:211-240
ISSN:
Container-title:Scanning Tunneling Microscopy and Related Methods
language:
Short-container-title:

Author:

Feenstra R. M.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-015-7871-4_11

Reference63 articles.

1. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).

2. G. Binnig and H. Rohrer, Helvetica Physica Acta 55, 726 (1982).

3. G. Binnig and H. Rohrer, Surface Science 152/153, 17 (1985).

4. G. Binnig and H. Rohrer, IBM J. Res. Develop. 30, 355 (1986).

5. P. K. Hansma and J. Tersoff, J. Appl. Phys. 61, R1 (1987).

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Examining tunnel current responses to acoustic excitation for STMs in gaseous environments;AIP Advances;2018-09

2. Scanning Tunneling Microscopy/Spectroscopy in Analysis of Surfaces;Encyclopedia of Analytical Chemistry;2006-09-15

3. Electronic and topographic structure of ta-C, ta-C:N and ta-C:B investigated by scanning tunnelling microscopy;Diamond and Related Materials;1999-03

4. Solid-Phase Epitaxy of Thin Silicon Film on Si(111) Surface Studied by Scanning Tunneling Microscopy;Israel Journal of Chemistry;1996

5. Introduction;Springer Series in Surface Sciences;1994

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