Quantitative Phase Analysis: Method Developments
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-94-007-5580-2_21.pdf
Reference18 articles.
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3. Ferrari M, Lutterotti L (1994) Method for the simultaneous determination of anisotropic residual stresses and texture by X-ray diffraction. J Appl Phys 76(11):7246–7255
4. Cont L, Chateigner D, Lutterotti L, Ricote J, Calzada ML, Mendiola J (2002) Combined X-ray texture-structure-microstructure analysis applied to ferroelectric ultrastructures: a case study on Pb0. 76Ca0. 24TiO3. Ferroelectrics 267:323–328
5. Lutterotti L (2010) Total pattern fitting for the combined size-strain-stress-texture determination in thin film diffraction. Nuclear Inst Methods Phys Res B 268:334–340
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