Scanning Spectro-Microscopy with 250 to 800 eV X-Rays
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Published:1997
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Page:53-74
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Container-title:Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale
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Publisher
Springer Netherlands
Reference25 articles.
1. For a somewhat dated overview that however nevertheless lists most of the spectromicroscopy efforts presently under way, see Ade, H.W., (1992) Scanning photoemission microscopy with synchrotron radiation, Nucl. Instr. Meths. in Phys. Res. A. 319, 311. Also see reference [5] and articles and references therein for some of the newer developments. 2. Tonner, B.P., Harp, G.R., Koranda, S.F., and Zhang, J., (1992) An electrostatic microscope for synchrotron radiation X-ray absorption microspectroscopy, Rev. Sci. Instr. 63, 564. 3. Kunz, C. and Voss, J., (1995) Scientific progress and improvement of optics in the VUV range, Rev. Sci. Instrum. 66, 2021. 4. Ng, W., Ray-Chaudhuri, A.K., Liang, S., Singh, S., Solak, H., Welnak, J., Cerrina, F., Margaritondo, G., Underwood, J.H., Kortright, J.B., and Perera, R.CC, (1994) High Resolution Spectromicroscopy with MAXIMUM: Photoemission Reaches the 1000 A Scale, Nucl. lustrum. Meth. A347, 422. 5. Rossei, R., (1995) Chemical, Structural and Electronic Analysis of Heterogenous Sufaces on Nanometer Scale, Klewer Academic Puplishers, Dordrecht. These proceedings.0
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