Author:
Pecht Michael,Lall Pradeep,Hakim Edward
Reference61 articles.
1. Abbott, D. A., and Turner, J. A., Some Aspects of GaAs MESFET Reliability. IEEE Transactions on Microwave Theory and Technology, MTT, 24, 1976, 317.
2. Amerasekera, E. A., and Campbell, D. S., Electrostatic Pulse Breakdown in HMOs Devices. Quality and Reliability Engineering International, 2, 1986, 107–116.
3. Amerasekera, E. A., and Campbell, D. S., Failure Mechanisms in Semiconductor Devices, New York: John Wiley and Sons, 1987, 12–96.
4. Anolick, E. S., and Nelson, G. R., Low Field Time Dependent Dielectric Integrity. Proceedings of the 17th Annual IEEE Reliability Physics Symposium, 1979, 1.
5. Baglee, D. A., Characteristics and Reliability of 100 Oxides. International Reliability Physics Symposium, 1984, 152–155.
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