In Situ and Ex Situ Examination of Passivating Cu2O Layers with Exafs and Reflexafs-Reference-Cited by-同舟云学术

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In Situ and Ex Situ Examination of Passivating Cu2O Layers with Exafs and Reflexafs

Published:1994 Issue: Volume: Page:295-310
ISSN:
Container-title:Synchrotron Techniques in Interfacial Electrochemistry
language:
Short-container-title:

Author:

Strehblow H.-H.,Borthen P.,Druska P.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-017-3200-0_17

Reference28 articles.

1. K.J. Vetter, Electrochemical Kinetics,Academic Press, New York, 1967, page 733 ff.

2. H. Kaesche, Die Korrosion der Metalle, Springer Verlag, 1979, page 173 ff.

3. H.-H. Strehblow, Corrosion 91, NACE Proceedings 76, March 1991, Cincinnati, Ohio, USA

4. H.-H. Strehblow, Surf. Interf. Anal., 12 (1988) 363

5. P. Marcus and J. Grimai, Corr. Sci., 33 (1992) 805

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2. General corrosion of copper in domestic drinking water installations: scientific background and mechanistic understanding;Corrosion Engineering, Science and Technology;2006-03

3. In Situ STM Study of the Initial Stages of Anodic Oxidation of Cu(111) in the Presence of Sulfates;Journal of The Electrochemical Society;2003

4. Mechanism of Copper Passivation in Aqueous Sodium Carbonate−Bicarbonate Solution Derived from Combined X-ray Photoelectron Spectroscopic and Electrochemical Data;The Journal of Physical Chemistry B;1998-06-20

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