Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/LFM-Reference-Cited by-同舟云学术

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Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/LFM

Published:1995 Issue: Volume: Page:519-524
ISSN:
Container-title:Forces in Scanning Probe Methods
language:
Short-container-title:

Author:

Schimmel Th.,Kemnitzer R.,Küppers J.,Kloc Ch.,Lux-Steiner M.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-011-0049-6_48

Reference15 articles.

1. H. Fuchs, R. Laschinski and Jh. Schimmel, Europhys. Lett. 13(4) (1990) 307

2. Th. Schimmel, L. Eng, H. Fuchs and M. Lux-Steiner, Annales de Chimie 17 (1992) 205

3. Jh. Schimmel, H. Fuchs, S. Akari and K. Dransfeld, Appl. Phys. Lett. 58 (1991) 1039

4. H. Fuchs and Jh. Schimmel, Adv. Mater. 3 (1991) 112

5. Jh. Schimmel, R. Kemnitzer, J. Küppers, H. Fuchs and M. Lux-Steiner, submitted

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1. Imaging atomically sharp crack tips in mica by contact mode AFM under ambient conditions;The European Physical Journal Applied Physics;2005-04-14

2. Nanostructuring of Calcite Surfaces by Tribomechanical Etching with the Tip of an Atomic Force Microscope;Fundamentals of Tribology and Bridging the Gap Between the Macro- and Micro/Nanoscales;2001

3. Structuring of mica surfaces with a vibrating AFM tip;Surface Science;1998-05

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