Physics in Laser Near-Field Nanomanufacturing: Fundamental Understanding and Novel Probing
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-94-017-9780-1_100915
Reference20 articles.
1. Lu, Y.F., Hu, B., Mai, Z.H., Wang, W.J., Chim, W.K., Chong, T.C.: Laser-scanning probe microscope based nanoprocessing of electronics materials. Jpn. J. Appl. Phys. 1(40), 4395–4398 (2001)
2. Chen, X.W., Wang, X.W.: Near-field thermal transport in a nanotip under laser irradiation. Nanotechnology 22, 075204 (2011)
3. Chen, X.W., Wang, X.W.: Microscale spatially resolved thermal response of Si nanotip to laser irradiation. J. Phys. Chem. C 115, 22207–22216 (2011)
4. McCarthy, B., Zhao, Y.M., Grover, R., Sarid, D.: Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip. Appl. Phys. Lett. 86, 111914 (2005)
5. Yue, Y.A., Chen, X.W., Wang, X.W.: Noncontact Sub-10 nm temperature measurement in near-field laser heating. ACS Nano 5, 4466–4475 (2011)
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