1. a. G. Ehrlich and K. Stolt, Ann. Rev. Phys. Chem. 31, 603 (1980); b. T. T. Tsong, Rpt. Progress Phys. 51, 759 (1988); c. papers by D. W. Bassett, and T. T. Tsong in Proc. NATO Adv. Summer Inst. on Surface Mobilities of Solid Materials, Vol. B36, 1983, Plenum, V. T. Binh ed.
2. P. J. Feibelman, Ann. Rev. Phys. Chem. 40, 261 (1989); Y. Li, M. R. Press, S. N. Khanna and P. Jena, Phys. Rev. B41, 4930 (1990).
3. See for an example T. T. Tsong, Atom-Probe Field Ion Microscopy, Cambridge Univ. Press, Cambridge, New York (1990).
4. C. L. Chen and T. T. Tsong, Phys. Rev. Lett. 64, 3147 (1990); G. L. Kellogg and P. J. Feibelman, Phys. Rev. Lett. 64, 3143 (1990); P. J. Feibelman, Phys. Rev. Lett. 65, 729 (1990).
5. J. Liu, C. W. Wu and T. T. Tsong, Phys. Reb. B43, 11595 (1991).