Infrared Scanning Near-Field Microscopy
Author:
Keilmann F.,Knoll B.
Publisher
Springer Netherlands
Reference11 articles.
1. E.A. Ash and G. Nicholls, Nature 237, 510 (1972)
2. D.W. Pohl, Europhys. News 26, 75 (1995)
3. F. Keilmann in M. Nieto-Vesperinas, ed.: Optics at the Nanometer Scale, pp. 235–245, Kluwer Acad. Publ., Amsterdam 1996
4. M. Fee, S. Chu and T. Hänsch, Opt. Commun. 69, 219 (1989)
5. F. Keilmann, U.S. patent no. 4, 994, 818 (1991, filed 1988)