An Analysis of the Broadening Induced by Beam Damage in Transmission Electron Diffraction Spots from an Oriented Aliphatic Monolayer-Reference-Cited by-同舟云学术

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An Analysis of the Broadening Induced by Beam Damage in Transmission Electron Diffraction Spots from an Oriented Aliphatic Monolayer

Published:1991 Issue: Volume: Page:365-375
ISSN:
Container-title:Electron Crystallography of Organic Molecules
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Author:

Steitz R.,Peterson I. R.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-011-3278-7_33

Reference48 articles.

1. e.g. Glaeser, R.M. (1979) Chapter 16 in Introduction to Analytical Electron Microscopy, Eds Hren, J.J., Goldstein, J.I. and Joy, D.C., Plenum, New York

2. Vesely, D. (1984) Ultramicroscopy 14, 279

3. Henderson, R. and Glaeser, R. M. (1985) Ultramicroscopy 16, 139

4. Wade, R.H. (1984) Ultramicroscopy 14, 265

5. Knapek, E., Formanek, H., Lefranc, G. and Dietrich, I. (1984) Ultramicroscopy 14, 253

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural Relationships between Floating and Deposited Monolayers of Docosanoic Acid;Berichte der Bunsengesellschaft für physikalische Chemie;1991-11

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