Defect-Free Vitreous Networks: The Idealised Structure of SiO2 and Related Glasses-Reference-Cited by-同舟云学术

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Defect-Free Vitreous Networks: The Idealised Structure of SiO2 and Related Glasses

Published:2000 Issue: Volume: Page:1-35
ISSN:
Container-title:Defects in SiO2 and Related Dielectrics: Science and Technology
language:
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Author:

Wright Adrian C.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-010-0944-7_1

Reference66 articles.

1. A.C. Wright, Wiss. Z Friedrich-Schiller-Univ. Jena, Naturwiss. Reihe 36 (1987), 943.

2. J.A.E. Desa, A.C. Wright, J. Wong and R.N. Sinclair, J. Non-Cryst. Solids 51 (1982), 57.

3. A.A. Lebedev, Trudy Gos. Opt. Inst. 2 (1921), 1.

4. M.L. Frankenheim, Die Lehre von der Cohãsion (Breslau, 1835), p 389.

5. B.E. Warren, J. Appl Phys. 8 (1937), 645.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomistic Modeling of Defects Implicated in the Bias Temperature Instability;Bias Temperature Instability for Devices and Circuits;2013-09-10

2. The oxide gate dielectric: do we know all we should?;Journal of Physics: Condensed Matter;2005-05-13

3. Structure and properties of defects in amorphous silica: new insights from embedded cluster calculations;Journal of Physics: Condensed Matter;2005-05-13

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