The Tetrahedral Tip as a Probe for Scanning Near-Field Optical Microscopy
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-94-011-1978-8_28
Reference12 articles.
1. Betzig E., J.K. Trautman. (1992). ‘Near-Field Optics: Microscopy Beyond the Diffraction Limit.’ Science 257, 189–195. See also these proceedings.
2. Roberts A. (1991) ‘Field Detection by Subwavelength Aperture probes. SPIE 1556 Scanning Microscopy Instrumentation, 11-18. See also these proceedings.
3. Keilmann F. (1988) German Patent DE 3837389 C1. See also these proceedings.
4. Fee M., S. Chu, T.W. Hänsch (1989). Optics Communications 69, 219–224.
5. Fischer U.Ch., M. Zapletal (1991). ‘The Concept of the Coaxial Tip as a Probe for Scanning Near Field Optical Microscopy and Steps towards a Realisation.’ Ultramicroscopy 42-44, 393–398)
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