1. Irvin, J.C. and Loya, A. (1978), Bell Syst. Tech. J., 57(8) pp. 2823–2846.
2. White, P.M., Hewitt, B.L. and Turner, J.S. (1978), “Reliability investigation of GaAs power FETs with Al gate”, Eur. Microwave Conf. Paris.
3. Christou, A. and Sleger, K. (1977), 6th Biennial Conf. on Active Microwave Semiconductor Devices and Circuits, Cornell.
4. Sinha, A.K. and Poate, J.M. (1973), Appl. Phys. Lett. 23, 666.
5. Chino, K. and Wada, Y. (1977), Jpn. J. Appl. Phys. 16, 1823.