Edge devices-oriented surface defect segmentation by GhostNet Fusion Block and Global Auxiliary Layer
Author:
Publisher
Springer Science and Business Media LLC
Subject
Information Systems
Link
https://link.springer.com/content/pdf/10.1007/s11554-023-01394-5.pdf
Reference36 articles.
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3. Liu, G.: Surface defect detection methods based on deep learning: a brief review. In: 2020 2nd International Conference on Information Technology and Computer Application (ITCA), (2020). pp. 200–203 (2020). https://doi.org/10.1109/ITCA52113.2020.00049
4. Poxi, H., Chen, W., Gao, J.: Overview of surface defect detection methods based on deep learning. In: Wang, Y., Yu, T., Wang, K. (eds) Advanced Manufacturing and Automation XII, (2023). pp. 123–128 (2023)
5. Minaee, S., Boykov, Y., Porikli, F., Plaza, A., Kehtarnavaz, N., Terzopoulos, D.: Image segmentation using deep learning: a survey. IEEE Trans. Pattern Anal. Mach. Intell. 44(7), 3523–3542 (2022). https://doi.org/10.1109/TPAMI.2021.3059968
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