Structural, surface morphological and optical properties of nanocrystalline Cu2O films prepared by RF magnetron sputtering: substrate bias effect
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://link.springer.com/content/pdf/10.1007/s12648-012-0057-7.pdf
Reference37 articles.
1. K Akimoto, S Ishizuka, M Yanagita, Y Nawa, G K Paul and T Sakurai Solar Energy 80 715 (2006)
2. E A Souza, R Landers, L P Cardoso, T G S Cruz, M H Tabacniks and A Gorenstein J. Power Sources 155 358 (2006)
3. H Zhu, J Zhang, C Li, F Pan, T Wang and B Huang Thin Solid Films 517 5700 (2009)
4. N Ozer and F Tepehan Solar Energy Mater. Solar Cells 30 13 (1993)
5. R Dong, D S Lee, W F Xiang, S J Oh, D J Seoung, S H Heo, H J Choi, M J K Won, S N Seo, M B Pyum, M Hasan and H S Hwang Appl. Phys. Lett. 90 042107 (2007)
Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Investigation of plasma process in deposition of cupric oxide film produced by radio frequency magnetron sputtering;Thin Solid Films;2024-02
2. Investigation of Plasma Process in Deposition of Cupric Oxide Film Produced by Rf Magnetron Sputtering;2023
3. Hollow 1D copper oxide nanostructures with enhanced activity for catalytic reduction and photocatalytic degradation of organic pollutants;Surfaces and Interfaces;2021-02
4. Charge transfer balancing of planar perovskite solar cell based on a low cost and facile solution-processed CuOx as an efficient hole transporting layer;Journal of Materials Science: Materials in Electronics;2021-01
5. High performance Cu2O film/ZnO nanowires self-powered photodetector by electrochemical deposition*;Chinese Physics B;2020-09-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3