Impact of Radiation on Electronics
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-15069-7_4
Reference139 articles.
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3. Allenspach M, Brews JR, Mouret I, Schrimpf RD, Galloway KF (1994) Evaluation of SEGR threshold in power MOSFETs. IEEE Trans Nucl Sci 41:2160–2166
4. Amusan OA, Witulski AF, Massengill LW, Bhuva BL, Fleming PR, Alles ML, Sternberg AL, Black JD, Schrimpf RD (2006) Charge collection and charge sharing in a 130 nm CMOS technology. IEEE Trans Nucl Sci 53:3253–3258
5. Barth JL, LaBel KA, Poivey C (2004) Radiation assurance for the space environment. In: International conference on integrated circuit design and technology, 2004. ICICDT’04, pp 323–333
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