1. Agoyan, M., Dutertre, J.M., Mirbaha, A.P., Naccache, D., Ribotta, A.L., Tria, A.: How to flip a bit? In: IEEE International On-Line Testing Symposium (IOLTS), pp. 235–239 (2010)
2. Agoyan, M., Dutertre, J.M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: on critical paths and clock faults. In: International Conference on Smart Card Research and Advanced Application (CARDIS), pp. 182–193 (2010)
3. Ali, S.S., Mukhopadhyay, D.: A differential fault analysis on AES key schedule using single fault. In: Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 35–42 (2011)
4. Ali, S.S., Mukhopadhyay, D.: An improved differential fault analysis on AES-256. In: International Conference on Cryptology in Africa (AFRICACRYPT), pp. 332–347 (2011)
5. Ali, S.S., Mukhopadhyay, D.: Differential fault analysis of AES-128 key schedule using a single multi-byte fault. In: International Conference on Smart Card Research and Advanced Applications (CARDIS), pp. 50–64 (2011)