Nanoscale Electrical Contacts Grown by Focused Ion Beam (FIB)-Induced Deposition
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-02874-3_5
Reference71 articles.
1. Xia, Y., Rogers, J.A., Paul, K.E., Whitesides, G.M.: Unconventional methods for fabricating and patterning nanostructures. Chem. Rev. 99, 1823 (1999)
2. Martín, J.I., Nogués, J., Liu, K., Vicent, J.L., Schuller, I.K.: Ordered magnetic structures: fabrication and properties. J. Magn. Magn. Mater. 256, 449 (2003)
3. Fan, J., Michalik, J., Casado, L., Roddaro, S., Ibarra, M.R., De Teresa, J.M.: Investigation of the influence on graphene by using electron-beam and photo-lithography. Solid State Commun. 151, 1574–1578 (2011)
4. Bezryadin, A., Verschueren, A.R.M., Tans, S.J., Dekker, C.: Multiprobe transport experiments on individual single-wall carbon nanotubes. Phys. Rev. Lett. 80, 4036–4039 (1998)
5. Gao, B., Chen, Y.F., Fuhrer, M.S., Glattli, D.C., Bachtold, A.: Four-point resistance of individual single-wall carbon nanotubes. Phys. Rev. Lett. 95, 196802 (2005)
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